The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 12, 2016
Filed:
Mar. 25, 2011
Chun-cheng Chen, Hsin-Chu, TW;
Hung-chih Lin, Hsin-Chu, TW;
Mill-jer Wang, Hsin-Chu, TW;
Hao Chen, Luzhou, TW;
Ching-nen Peng, Hsin-Chu, TW;
Chun-Cheng Chen, Hsin-Chu, TW;
Hung-Chih Lin, Hsin-Chu, TW;
Mill-Jer Wang, Hsin-Chu, TW;
Hao Chen, Luzhou, TW;
Ching-Nen Peng, Hsin-Chu, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
A method includes testing a first device and a second device identical to each other and comprising integrated circuits. The testing of the first device is performed according to a first test sequence of the first device, wherein the first test sequence includes a plurality of ordered test items, and wherein the first test sequence includes a test item. A test priority of the test item is calculated based on a frequency of fails of the test item in the testing of a plurality of devices having an identical structure as the first device. The first test sequence is then adjusted to generate a second test sequence in response to the test priority of the test item, wherein the second test sequence is different from the first test sequence. The second device is tested according to the second test sequence.