The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Mar. 05, 2010
Applicants:

Grzegorz Mrugalski, Swarzedz, PL;

Nilanjan Mukherjee, Wilsonville, OR (US);

Janusz Rajski, West Linn, OR (US);

Dariusz Czysz, Wielkopolski, PL;

Jerzy Tyszer, Poznan, PL;

Inventors:

Grzegorz Mrugalski, Swarzedz, PL;

Nilanjan Mukherjee, Wilsonville, OR (US);

Janusz Rajski, West Linn, OR (US);

Dariusz Czysz, Wielkopolski, PL;

Jerzy Tyszer, Poznan, PL;

Assignee:

Mentor Graphics Corporation, Wilsonville, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The test data compression scheme is based on deterministic vector clustering. Test cubes that feature many similar specified bits are merged into a parent pattern in the presence of conflicts. The parent pattern along with a control pattern and incremental patterns representing conflicting bits are encoded efficiently. A tri-modal decompressor may be used to decompress the test data.


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