The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 29, 2010
Filed:
Mar. 05, 2004
Rodney Lee Robison, Mesa, AZ (US);
Jacques Faguet, Gilbert, AZ (US);
Bruce Gittleman, Scottsdale, AZ (US);
Tugrul Yasar, Scottsdale, AZ (US);
Frank Cerio, Phoenix, AZ (US);
Jozef Brcka, Mesa, AZ (US);
Rodney Lee Robison, Mesa, AZ (US);
Jacques Faguet, Gilbert, AZ (US);
Bruce Gittleman, Scottsdale, AZ (US);
Tugrul Yasar, Scottsdale, AZ (US);
Frank Cerio, Phoenix, AZ (US);
Jozef Brcka, Mesa, AZ (US);
Tokyo Electron Limited, Tokyo, JP;
Abstract
An iPVD apparatus () is programmed to deposit material () onto semiconductor substrates () by cycling between deposition and etch modes within a vacuum chamber (). Static magnetic fields are kept to a minimum during at least the etch modes, at least less than 150 Gauss, typically less than 50 Gauss, and preferably in the range of 0-10 Gauss. Static magnetic fields during deposition modes may be more than 150 Gauss, in the range of 0-50 Gauss, or preferably 20-30 Gauss, and may be the same as during etch modes or switched between a higher level during deposition modes and a lower level, including zero, during etch modes. Such switching may be by switching electromagnet current or by moving permanent magnets, by translation or rotation. Static magnetic fields are kept to a minimum during at least the etch modes, at least less than 150 Gauss, typically less than 50 Gauss, and preferably in the range of 1-10 Gauss. The modes may operate at different power and pressure parameters. Pressure of more than 50 mTorr are preferred for deposition in a thermalized plasma while pressure of less than a few mTorr is preferred for etching.