The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Mar. 01, 2006
Hiromasa Hashimoto, Fukushima, JP;
Yasuharu Ariga, Fukushima, JP;
Hisashi Masumura, Fukushima, JP;
Kouzi Kitagawa, Fukushima, JP;
Toshimasa Kubota, Tokyo, JP;
Takahiro Matsuda, Fukui, JP;
Hiromasa Hashimoto, Fukushima, JP;
Yasuharu Ariga, Fukushima, JP;
Hisashi Masumura, Fukushima, JP;
Kouzi Kitagawa, Fukushima, JP;
Toshimasa Kubota, Tokyo, JP;
Takahiro Matsuda, Fukui, JP;
Shin-Etsu-Handotai Co., Ltd., Tokyo, JP;
Abstract
The present invention provides a polishing headcomprising a carrier, a guide ring, a dress ring, and a head body, wherein the head bodyis rotatable, and holds the carrier, the guide ring, and the dress ring; the head bodyhas a reversed-bowl shape and has a hollow; the dress ring, and at least the guide ring or the carrier are held by being coupled to a lower brim of the head body via a diaphragm; the hollow of the head body is sealed. During polishing, the pressure of the sealed hollow is adjusted with a pressure regulating mechanismcommunicating with the hollow, thereby elastically deforming the diaphragm. As a result, a wafer W can be polished while the wafer and the dress ring are pressed with a given pressing force against a polishing padon a turn tablewith rotating the wafer held by the carrier and the dress ring. Consequently, there is provided a polishing head or the like with which excessive polishing in the outer periphery of a semiconductor wafer can be prevented and generation of impressions or scratches in the edge portion of the wafer can be prevented effectively.