The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2009

Filed:

May. 03, 2006
Applicants:

Madhavi R. Chandrachood, Sunnyvale, CA (US);

Richard Lewington, Hayward, CA (US);

Darin Bivens, San Mateo, CA (US);

Ajay Kumar, Cupertino, CA (US);

Ibrahim M. Ibrahim, Santa Clara, CA (US);

Michael N. Grimbergen, Redwood City, CA (US);

Renee Koch, Brentwood, CA (US);

Sheeba J. Panayil, Santa Clara, CA (US);

Inventors:

Madhavi R. Chandrachood, Sunnyvale, CA (US);

Richard Lewington, Hayward, CA (US);

Darin Bivens, San Mateo, CA (US);

Ajay Kumar, Cupertino, CA (US);

Ibrahim M. Ibrahim, Santa Clara, CA (US);

Michael N. Grimbergen, Redwood City, CA (US);

Renee Koch, Brentwood, CA (US);

Sheeba J. Panayil, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B44C 1/22 (2006.01); C03C 15/00 (2006.01); C03C 25/68 (2006.01); C23F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for processing a workpiece in a plasma reactor chamber having radially inner and outer source power applicators at a ceiling of the chamber facing the workpiece, the inner and outer source power applicators and the workpiece sharing a common axis of symmetry. The method includes applying RF source power to the source power applicator, and introducing a process gas into the reactor chamber so as to carry out a plasma process on the workpiece characterized by a plasma process parameter, the plasma process parameter having a spatial distribution across the surface of the workpiece. The method further includes rotating at least the outer RF source power applicator about a radial tilt axis to a position at which the spatial distribution of the plasma process parameter has at least a nearly minimal non-symmetry relative to the common axis of symmetry, and translating the inner source power applicator relative to the outer source power applicator along the axis of symmetry to a location at which the spatial distribution has at least a nearly minimal non-uniformity across the surface of the workpiece.


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