The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Jan. 11, 2005
Vaidyanathan Balasubramaniam, Richardson, TX (US);
Yasunori Hatamura, Salem, MA (US);
Masaaki Hagihara, Peabody, MA (US);
Eiichi Nishimura, Malden, MA (US);
Rie Inazawa, Legal Representative, Hokuto, JP;
Vaidyanathan Balasubramaniam, Richardson, TX (US);
Yasunori Hatamura, Salem, MA (US);
Masaaki Hagihara, Peabody, MA (US);
Eiichi Nishimura, Malden, MA (US);
Rie Inazawa, legal representative, Hokuto, JP;
Tokyo Electron Limited, Inc., Tokyo, JP;
Abstract
A method is provided for plasma ashing to remove photoresist remnants and etch residues formed during preceding plasma etching of dielectric layers. The ashing method uses a two-step plasma process involving a hydrogen-containing gas, where low or zero bias is applied to the substrate in the first cleaning step to remove significant amount of photoresist remnants and etch residues from the substrate, in addition to etching and removing detrimental fluorocarbon residues from the chamber surfaces. An increased bias is applied to the substrate in the second cleaning step to remove the remains of the photoresist and etch residues from the substrate. A chamber pressure less than 20 mTorr is utilized in the second cleaning step. The two-step process reduces the memory effect commonly observed in conventional one-step ashing processes. A method of endpoint detection can be used to monitor the ashing process.