The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Aug. 27, 2002
Applicants:

Swee Kwang Chua, Singapore, SG;

Siu Waf Low, Singapore, SG;

Yong Poo Chia, Singapore, SG;

Meow Koon Eng, Singapore, SG;

Yong Loo Neo, Singapore, SG;

Suan Jeung Boon, Singapore, SG;

Suangwu Huang, Singapore, SG;

Wei Zhou, Singapore, SG;

Inventors:

Swee Kwang Chua, Singapore, SG;

Siu Waf Low, Singapore, SG;

Yong Poo Chia, Singapore, SG;

Meow Koon Eng, Singapore, SG;

Yong Loo Neo, Singapore, SG;

Suan Jeung Boon, Singapore, SG;

Suangwu Huang, Singapore, SG;

Wei Zhou, Singapore, SG;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/44 ; H01L021/48 ; H01L021/50 ; H01L021/4763 ;
U.S. Cl.
CPC ...
Abstract

The present invention defines a packaging implementation providing a multichip multilayer system on a chip solution. Greater integration of a plurality and variety of known good die are contained within cavities formed in a separate substrate is achieved. Additional redistribution and interconnect layers above the multichip configuration may be formed with the redistribution layers terminating in electrical connections such as conductive bumps or balls. In one embodiment, the cavities of the substrate receive signal device connections, such as conductive bumps, of a plurality of semiconductor dice in a flip-chip configuration. A portion of the back surface of the substrate is then removed to a depth sufficient to expose the conductive bumps. In another embodiment, the cavities receive the semiconductor dice with the active surface of the semiconductor dice facing up, wherein metal layer connections are formed and coupled bond pads or other electrical connectors of the semiconductor dice.


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