The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2005

Filed:

Sep. 24, 2001
Applicants:

Yih-ann Lin, Taipei, TW;

Tung-heng Shie, Hsinchu, TW;

Kai-ming Ching, Taiping, TW;

Sheng-liang Pan, Hsinchu, TW;

Kuo-liang LU, Hsin-Chu, TW;

Inventors:

Yih-Ann Lin, Taipei, TW;

Tung-Heng Shie, Hsinchu, TW;

Kai-Ming Ching, Taiping, TW;

Sheng-Liang Pan, Hsinchu, TW;

Kuo-Liang Lu, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D005/02 ;
U.S. Cl.
CPC ...
Abstract

A method of forming a bump structure through the use of an electroplating solution, comprising the following steps. A substrate having an overlying conductive structure is provided. A patterned dry film resist is formed over the conductive structure. The patterned dry film resist having a trench exposing a portion of conductive structure. The patterned dry film resist adhering to the conductive structure at an interface. The structure is treated with a treatment that increases the adherence of the patterned dry film resist to the conductive structure at the interface. A conductive plug is over the exposed portion of the conductive structure within the trench through the use of the electroplating solution. The increased adhesion of the patterned dry film resist to the conductive structure at the interface preventing the electroplating solution from penetrating the interface of the patterned dry film resist and the conductive structure during the formation of the conductive plug. The patterned dry film resist is removed from the conductive structure. The conductive plug is reflowed to form the bump structure.


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