The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1990

Filed:

Aug. 07, 1989
Applicant:
Inventors:

Kyoichi Suwa, Yokohama, JP;

Kazuo Ushida, Tokyo, JP;

Takeshi Suto, Funabashi, JP;

Masaomi Kameyama, Tokyo, JP;

Shigeru Hirukawa, Kashiwa, JP;

Shinichi Nakamura, Kawaguchi, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
355 71 ; 355 53 ;
Abstract

A projection exposure apparatus is provided with an illuminating optical system for illuminating a reticle having a predetermined fine pattern, a projection optical system for projecting the pattern of the reticle onto a wafer, and diaphragm means so constructed as to vary the aperture of a diaphragm of the projection optical system, wherein means for receiving information on the pattern present on the reticle, and means for determining a diaphgram aperture capable of eliminating the high-order diffracted light generated by the pattern of the reticle according to information as stated above and controlling the aperture of variable diaphragm means of the projection optical system, are provided.


Find Patent Forward Citations

Suwa, Kyoichi. (1990). Projection exposure apparatus (U.S. Patent No. 4931830). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4931830

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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