Company Filing History:
Years Active: 1990-1995
Title: The Innovations of Shinichi Nakamura
Introduction
Shinichi Nakamura is a prominent inventor based in Kawaguchi, Japan. He is known for his contributions to the field of optical technology, particularly in the development of advanced exposure methods and apparatuses. With a total of 2 patents to his name, Nakamura has made significant strides in enhancing the precision of photolithography processes.
Latest Patents
Nakamura's latest patents include an "Exposure Condition Measurement Method" and a "Projection Exposure Apparatus." The exposure condition measurement method involves a technique for measuring the conditions under which a pattern is exposed onto a photosensitive substrate. This method allows for the adjustment of exposure conditions to achieve optimal results in resist image formation. The projection exposure apparatus is designed to illuminate a reticle with a fine pattern and project that pattern onto a wafer. It features a diaphragm system that can adjust the aperture to eliminate high-order diffracted light, ensuring high-quality pattern transfer.
Career Highlights
Throughout his career, Nakamura has been associated with Nikon Corporation, a leading company in imaging and optical products. His work has contributed to the advancement of photolithography technology, which is crucial in the manufacturing of semiconductors and other precision devices.
Collaborations
Nakamura has collaborated with notable colleagues such as Kyoichi Suwa and Shigeru Hirukawa. These partnerships have fostered innovation and have led to the development of cutting-edge technologies in the field.
Conclusion
Shinichi Nakamura's contributions to optical technology and photolithography have established him as a key figure in the industry. His innovative patents and collaborations continue to influence advancements in imaging technology.