The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2026

Filed:

Mar. 27, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chih-Liang Chen, Hsinchu, TW;

Chih-Ming Lai, Hsinchu, TW;

Charles Chew-Yuen Young, Hsinchu, TW;

Chin-Yuan Tseng, Hsinchu, TW;

Jiann-Tyng Tzeng, Hsinchu, TW;

Kam-Tou Sio, Hsinchu, TW;

Ru-Gun Liu, Hsinchu, TW;

Wei-Liang Lin, Hsinchu, TW;

L. C. Chou, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10B 10/00 (2023.01); A61B 5/00 (2006.01); A61B 5/11 (2006.01); A61B 34/20 (2016.01); A61B 90/00 (2016.01); A61C 19/045 (2006.01); H10D 30/01 (2025.01); H10D 30/62 (2025.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H10D 84/83 (2025.01); H10P 50/00 (2026.01);
U.S. Cl.
CPC ...
A61C 19/045 (2013.01); A61B 5/0077 (2013.01); A61B 5/0088 (2013.01); A61B 5/1127 (2013.01); A61B 5/682 (2013.01); A61B 34/20 (2016.02); A61B 90/39 (2016.02); H10B 10/12 (2023.02); H10D 30/024 (2025.01); H10D 30/6211 (2025.01); H10D 84/0158 (2025.01); H10D 84/038 (2025.01); H10D 84/834 (2025.01); H10P 50/693 (2026.01); H10P 50/695 (2026.01); A61B 2034/2055 (2016.02); A61B 2034/2065 (2016.02); A61B 2090/3945 (2016.02); A61B 2090/3983 (2016.02); A61B 2090/3991 (2016.02); A61B 2560/0223 (2013.01); H10P 50/73 (2026.01);
Abstract

A method (of manufacturing fins for a semiconductor device) includes: forming semiconductor fins including ones thereof having a first cap with a first etch sensitivity (first capped fins) and second ones thereof having a second cap with a second etch sensitivity (second capped fins), the first and second etch sensitivities being different; and eliminating selected ones of the first capped fins and selected ones of the second capped fins.


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