The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2025

Filed:

Nov. 13, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Yu-Lien Huang, Jhubei, TW;

Ching-Feng Fu, Taichung, TW;

Huan-Just Lin, Hsinchu, TW;

Fu-Sheng Li, Taichung, TW;

Tsai-Jung Ho, Changhua County, TW;

Bor Chiuan Hsieh, Taoyuan, TW;

Guan-Xuan Chen, Taoyuan, TW;

Guan-Ren Wang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2005.12); H01L 21/768 (2005.12); H01L 23/535 (2005.12); H01L 27/088 (2005.12); H01L 29/06 (2005.12); H01L 29/08 (2005.12); H01L 29/417 (2005.12); H01L 29/66 (2005.12); H01L 29/78 (2005.12);
U.S. Cl.
CPC ...
H01L 21/823475 (2012.12); H01L 21/76805 (2012.12); H01L 21/76837 (2012.12); H01L 21/7684 (2012.12); H01L 21/76895 (2012.12); H01L 21/823418 (2012.12); H01L 21/823431 (2012.12); H01L 23/535 (2012.12); H01L 27/0886 (2012.12); H01L 29/0847 (2012.12); H01L 29/41791 (2012.12);
Abstract

A method may include forming a mask layer on top of a first dielectric layer formed on a first source/drain and a second source/drain, and creating an opening in the mask layer and the first dielectric layer that exposes portions of the first source/drain and the second source/drain. The method may include filling the opening with a metal layer that covers the exposed portions of the first source/drain and the second source/drain, and forming a gap in the metal layer to create a first metal contact and a second metal contact. The first metal contact may electrically couple to the first source/drain and the second metal contact may electrically couple to the second source/drain. The gap may separate the first metal contact from the second metal contact by less than nineteen nanometers.


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