The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Apr. 29, 2024
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chun-Hsien Huang, Hsinchu, TW;

I-Li Chen, Hsinchu, TW;

Pin-Wen Chen, Keelung, TW;

Yuan-Chen Hsu, Hsinchu, TW;

Wei-Jung Lin, Hsinchu, TW;

Chih-Wei Chang, Hsinchu, TW;

Ming-Hsing Tsai, Chu-Pei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2005.12); H01L 23/522 (2005.12); H01L 23/532 (2005.12);
U.S. Cl.
CPC ...
H01L 21/76861 (2012.12); H01L 21/76805 (2012.12); H01L 21/76826 (2012.12); H01L 21/76843 (2012.12); H01L 21/76877 (2012.12); H01L 23/5226 (2012.12); H01L 23/53257 (2012.12); H01L 23/53266 (2012.12);
Abstract

A method includes forming a first metallic feature, forming a dielectric layer over the first metallic feature, etching the dielectric layer to form an opening, with a top surface of the first metallic feature being exposed through the opening, and performing a first treatment on the top surface of the first metallic feature. The first treatment is performed through the opening, and the first treatment is performed using a first process gas. After the first treatment, a second treatment is performed through the opening, and the second treatment is performed using a second process gas different from the first process gas. A second metallic feature is deposited in the opening.


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