The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Dec. 18, 2020
Intel Corporation, Santa Clara, CA (US);
Nicole Thomas, Portland, OR (US);
Eric Mattson, Portland, OR (US);
Sudarat Lee, Hillsboro, OR (US);
Scott B. Clendenning, Portland, OR (US);
Tobias Brown-Heft, Portland, OR (US);
I-Cheng Tung, Hillsboro, OR (US);
Thoe Michaelos, Portland, OR (US);
Gilbert Dewey, Beaverton, OR (US);
Charles Kuo, Hillsboro, OR (US);
Matthew Metz, Portland, OR (US);
Marko Radosavljevic, Portland, OR (US);
Charles Mokhtarzadeh, Portland, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Integrated circuitry comprising a ribbon or wire (RoW) transistor stack within which the transistors have different threshold voltages (V). In some examples, a gate electrode of the transistor stack may include only one workfunction metal. A metal oxide may be deposited around one or more channels of the transistor stack as a solid-state source of a metal oxide species that will diffuse toward the channel region(s). As diffused, the metal oxide may remain (e.g., as a silicate, or hafnate) in close proximity to the channel region, thereby altering the dipole properties of the gate insulator material. Different channels of a transistor stack may be exposed to differing amounts or types of the metal oxide species to provide a range of Vwithin the stack. After diffusion, the metal oxide may be stripped as sacrificial, or retained.