The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2024
Filed:
May. 11, 2021
Applied Materials, Inc., Santa Clara, CA (US);
Tetsuya Ishikawa, San Jose, CA (US);
Swaminathan T. Srinivasan, Pleasanton, CA (US);
Matthias Bauer, Sunnyvale, CA (US);
Manjunath Subbanna, Bangalore, IN;
Ala Moradian, Sunnyvale, CA (US);
Kartik Bhupendra Shah, Saratoga, CA (US);
Errol Antonio C Sanchez, Santa Clara, CA (US);
Michael R. Rice, Pleasanton, CA (US);
Peter Reimer, Santa Clara, CA (US);
Marc Shull, San Jose, CA (US);
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
Embodiments described herein include processes and apparatuses relate to epitaxial deposition. A method for epitaxially depositing a material is provided and includes positioning a substrate on a substrate support surface of a susceptor within a process volume of a chamber body, where the process volume contains upper and lower chamber regions. The method includes flowing a process gas containing one or more chemical precursors from an upper gas inlet on a first side of the chamber body, across the substrate, and to an upper gas outlet on a second side of the chamber body, flowing a purge gas from a lower gas inlet on the first side of the chamber body, across the lower surface of the susceptor, and to a lower gas outlet on the second side of the chamber body, and maintaining a pressure of the lower chamber region greater than a pressure of the upper chamber region.