The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 16, 2023

Filed:

Mar. 29, 2021
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Yun Chen Hsieh, Baoshan Township, TW;

Hui-Jung Tsai, Hsinchu, TW;

Hung-Jui Kuo, Hsinchu, TW;

Chen-Hua Yu, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/768 (2006.01); H01L 21/3213 (2006.01); H01L 21/56 (2006.01); H01L 23/31 (2006.01); H01L 23/532 (2006.01); H01L 23/00 (2006.01); H01L 23/522 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76871 (2013.01); H01L 21/32139 (2013.01); H01L 21/565 (2013.01); H01L 21/76856 (2013.01); H01L 23/3107 (2013.01); H01L 23/5226 (2013.01); H01L 23/53238 (2013.01); H01L 24/09 (2013.01); H01L 24/14 (2013.01); H01L 24/17 (2013.01); H01L 24/32 (2013.01); H01L 2224/02379 (2013.01);
Abstract

A method includes forming a metal seed layer on a dielectric layer, and forming a patterned mask over the metal seed layer. An opening in the patterned mask is over a first portion of the dielectric layer, and the patterned mask overlaps a second portion of the dielectric layer. The method further includes plating a metal region in the opening, removing the patterned mask to expose portions of the metal seed layer, etching the exposed portions of the metal seed layer, performing a plasma treatment on a surface of the second portion of the dielectric layer, and performing an etching process on the surface of the second portion of the dielectric layer.


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