The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 25, 2023

Filed:

May. 28, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Haosheng Wu, San Jose, CA (US);

Jianshe Tang, San Jose, CA (US);

Hari Soundararajan, Sunnyvale, CA (US);

Shou-Sung Chang, Mountain View, CA (US);

Paul D. Butterfield, San Jose, CA (US);

Hui Chen, San Jose, CA (US);

Chih Chung Chou, San Jose, CA (US);

Alexander John Fisher, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 53/017 (2012.01); B24B 53/00 (2006.01); B24B 57/02 (2006.01); B24B 41/06 (2012.01);
U.S. Cl.
CPC ...
B24B 53/017 (2013.01); B24B 53/005 (2013.01); B24B 57/02 (2013.01); B24B 41/061 (2013.01);
Abstract

A method of temperature control for a chemical mechanical polishing system includes directing a gas that includes steam from an orifice onto the component in the polishing system while the component is spaced away from a polishing pad of the polishing system to raise a temperature of the component to an elevated temperature, and before the component returns to an ambient temperature, moving the component into contact with the polishing pad.


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