The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Aug. 01, 2018
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

George R. Mulfinger, Gansevoort, NY (US);

Timothy J. McArdle, Ballston Lake, NY (US);

Jody Fronheiser, Delmar, NY (US);

El Mehdi Bazizi, Saratoga Springs, NY (US);

Yi Qi, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01); H01L 29/08 (2006.01); H01L 27/12 (2006.01); H01L 29/165 (2006.01); H01L 21/84 (2006.01); H01L 21/02 (2006.01); H01L 21/308 (2006.01); H01L 21/306 (2006.01); H01L 21/3065 (2006.01); H01L 21/027 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
H01L 29/1033 (2013.01); H01L 21/02532 (2013.01); H01L 21/02598 (2013.01); H01L 21/3065 (2013.01); H01L 21/3081 (2013.01); H01L 21/30604 (2013.01); H01L 21/84 (2013.01); H01L 27/1203 (2013.01); H01L 29/0847 (2013.01); H01L 29/165 (2013.01); H01L 21/0274 (2013.01); H01L 21/02636 (2013.01); H01L 21/3086 (2013.01); H01L 29/1054 (2013.01); H01L 29/78687 (2013.01);
Abstract

Device structures for a field-effect transistor and methods of forming a device structure for a field-effect transistor. A channel region is arranged laterally between a first source/drain region and a second source/drain region. The channel region includes a first semiconductor layer and a second semiconductor layer arranged over the first semiconductor layer. A gate structure is arranged over the second semiconductor layer of the channel region The first semiconductor layer is composed of a first semiconductor material having a first carrier mobility. The second semiconductor layer is composed of a second semiconductor material having a second carrier mobility that is greater than the first carrier mobility of the first semiconductor layer.


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