The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

May. 29, 2012
Applicants:

Hidekazu Hayashi, Yokohama, JP;

Yohei Sato, Yokohama, JP;

Hisashi Okuchi, Yokohama, JP;

Hiroshi Tomita, Yokohama, JP;

Kazuyuki Mitsuoka, Nirasaki, JP;

Mitsuaki Iwashita, Nirasaki, JP;

Takehiko Orii, Nirasaki, JP;

Gen You, Nirasaki, JP;

Hiroki Ohno, Nirasaki, JP;

Takayuki Toshima, Koshi, JP;

Inventors:

Hidekazu Hayashi, Yokohama, JP;

Yohei Sato, Yokohama, JP;

Hisashi Okuchi, Yokohama, JP;

Hiroshi Tomita, Yokohama, JP;

Kazuyuki Mitsuoka, Nirasaki, JP;

Mitsuaki Iwashita, Nirasaki, JP;

Takehiko Orii, Nirasaki, JP;

Gen You, Nirasaki, JP;

Hiroki Ohno, Nirasaki, JP;

Takayuki Toshima, Koshi, JP;

Assignees:

Toshiba Memory Corporation, Minato-Ku, JP;

Tokyo Electron Limited, Minato-Ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/02 (2006.01); B08B 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67028 (2013.01); B08B 7/0021 (2013.01); H01L 21/02057 (2013.01); H01L 21/02101 (2013.01);
Abstract

A substrate processing method and apparatus which can remove an anti-drying liquid, which has entered a three-dimensional pattern with recessed portions formed in a substrate, in a relatively short time. The substrate processing method includes the steps of: carrying a substrate, having a three-dimensional pattern formed in a surface, into a processing container, said pattern being covered with an anti-drying liquid that has entered the recessed portions of the pattern; heating the substrate and supplying a pressurizing gas or a fluid in a high-pressure state into the processing container, thereby forming a high-pressure atmosphere in the processing container before the anti-drying liquid vaporizes to such an extent as to cause pattern collapse and bringing the anti-drying liquid into a high-pressure state while keeping the liquid in the recessed portions of the pattern; and thereafter discharging a fluid in a high-pressure state or a gaseous state from the processing container.


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