The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 30, 2018

Filed:

Nov. 28, 2017
Applicant:

Lam Research Corporation, Fremont, CA (US);

Inventors:

Michael C. Kellogg, San Francisco, CA (US);

Alexei Marakhtanov, Albany, CA (US);

John Patrick Holland, San Jose, CA (US);

Zhigang Chen, Campbell, CA (US);

Felix Kozakevich, Sunnyvale, CA (US);

Kenneth Lucchesi, Newark, CA (US);

Assignee:

Lam Research Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01J 37/147 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32155 (2013.01); H01J 37/1471 (2013.01); H01J 37/32366 (2013.01);
Abstract

Systems and methods for controlling directionality of ion flux at an edge region within a plasma chamber are described. One of the systems includes a radio frequency (RF) generator that is configured to generate an RF signal, an impedance matching circuit coupled to the RF generator for receiving the RF signal to generate a modified RF signal, and a plasma chamber. The plasma chamber includes an edge ring and a coupling ring located below the edge ring and coupled to the first impedance matching circuit to receive the modified RF signal. The coupling ring includes an electrode that generates a capacitance between the electrode and the edge ring to control the directionality of the ion flux upon receiving the modified RF signal.


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