Zhijian Ma

Title: Zhijian Ma: Innovator in Semiconductor Testing Technologies

Introduction

Zhijian Ma is a prominent inventor based in Cupertino, CA, known for his contributions to semiconductor testing technologies. With a total of 3 patents, he has made significant advancements in the field, particularly in methods and apparatuses for testing semiconductor wafers.

Latest Patents

One of his latest patents is titled "On-chip interface trap characterization and monitoring." This invention discloses a method and apparatus for testing semiconductor wafers using a test circuit that includes a waveform generator. The test circuit can evaluate a single transistor or multiple transistors simultaneously. The testing method involves applying a supply voltage to the waveform generator to produce pulses that are directed to the gate of the transistor under test. A bias voltage is then applied to the source and drain of the transistor, allowing for the measurement of the charge pumping current generated at the substrate. This process can be repeated at various bias voltage levels to gather additional current measurements, which help determine the maximum charge pumping current for the tested transistor. This information is crucial for assessing whether there is excessive 1/f noise in the device under examination.

Another notable patent is the "Method for forming photomask having test patterns in blading areas." This invention describes a photomask and a method for its formation, where die regions defining features for a semiconductor fabrication process are created on the photomask. Additionally, a test pattern for a different process step is formed in a blading area of the photomask. The photomask is then exposed to transfer the test pattern to a semiconductor substrate, allowing for the formation of test structures without the need for additional photomasks.

Career Highlights

Zhijian Ma is currently employed at Integrated Device Technology, Inc., where he continues to innovate in the semiconductor industry. His work focuses on enhancing testing methodologies that improve the reliability and performance of semiconductor devices.

Collaborations

Zhijian has collaborated with notable colleagues, including Chunbo Liu and Jeong Yeol Choi, contributing to various projects that advance semiconductor technology.

Conclusion

Zhijian Ma's innovative work in semiconductor testing has led to significant advancements in the field. His patents reflect a commitment to improving testing methodologies, which are essential for the development of reliable semiconductor devices.