St. Imier, Switzerland

Yves Salvade



 

Average Co-Inventor Count = 3.3

ph-index = 3

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2010-2014

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3 patents (USPTO):Explore Patents

Title: Yves Salvade: Innovator in Interferometric Distance Measurement

Introduction

Yves Salvade is a notable inventor based in St. Imier, Switzerland. He has made significant contributions to the field of interferometric distance measurement, holding a total of three patents. His work focuses on improving the accuracy and efficiency of distance measuring technologies.

Latest Patents

One of Yves Salvade's latest patents is a method for speckle mitigation in an interferometric distance meter. This method involves transmitting optical radiation to a target and receiving the scattered optical radiation. The process includes converting the received optical radiation into a signal and determining the true distance to the target while correcting for distance errors caused by speckle effects. Another significant patent is for generating a synthetic wavelength, which is particularly useful in interferometric distance measuring setups. This method involves using a primary laser source and modulating its frequency to create a synthetic wavelength by combining different wavelengths.

Career Highlights

Throughout his career, Yves Salvade has worked with prominent companies such as Leica Geosystems AG and Logitech Europe S.A. His experience in these organizations has allowed him to develop and refine his innovative techniques in distance measurement.

Collaborations

Yves has collaborated with notable professionals in his field, including Marcel Rohner and Olivier Mathis. These collaborations have contributed to the advancement of technology in interferometric measurements.

Conclusion

Yves Salvade's contributions to interferometric distance measurement through his patents and collaborations highlight his role as an influential inventor in this specialized field. His innovative methods continue to enhance the accuracy of distance measuring technologies.

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