The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2014
Filed:
Dec. 13, 2010
Marcel Rohner, Herisau, CH;
Yves Salvade, St. Imier, CH;
Marcel Rohner, Herisau, CH;
Yves Salvade, St. Imier, CH;
Leica Geosystems AG, Heerbrugg, CH;
Abstract
A method for speckle mitigation in an interferometric distance meter comprises the steps of transmitting optical radiation with at least one wavelength λ to a target to be surveyed, receiving a portion of the optical radiation scattered back by the target in an optical axis (OA), wherein the optical radiation forms a speckle field, converting the received optical radiation into at least one received signal, determining a true distance to the target from the received signal by absolute or incremental interferometric distance measurements. In the method the true pointing direction relative to the optical axis (OA) is determined, wherein the distance error due to speckle effects is corrected.