Kyoto, Japan

Yuzo Nagumo

This inventor holds 6 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Shimadzu Corporation. Active years: 2010-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuzo Nagumo. Retrieved from https://idiyas.com/inventor/yuzo-nagumo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 6 

% Patents Active = 16.7


Average Co-Inventor Count = 3.8

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Kyoto, JP (2010 - 2016)
  • Kizugawa, JP (2016)

Company Filing History:


Years Active: 2010-2016

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6 patents (USPTO):Explore Patents

Title: Yuzo Nagumo: Innovator in Surface Processing Technologies

Introduction

Yuzo Nagumo is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of surface processing technologies, holding a total of 6 patents. His innovative work focuses on monitoring systems that enhance the precision and efficiency of thin film measurements.

Latest Patents

Nagumo's latest patents include a surface processing progress monitoring system. This system features an index assigning section that estimates the thickness of a thin film based on the intensity of light reflected on a substrate. It utilizes a theoretical formula to express the relationship between the thickness of the thin film and the intensity of interference light. Additionally, it includes a layer thickness wide-range estimating section that estimates the layer thickness within a specified range. The system also has a selecting section for choosing an index and a determining section for finalizing the layer thickness estimation.

Another notable patent is the thickness monitoring device, which allows for real-time thickness measurement of an object, even when using a relatively narrow band light source. This device comprises a light source that produces measurement light with a predetermined wavelength bandwidth, an array detector for detecting interference light, and a data processing unit that computes the thickness based on the detected interference light changes.

Career Highlights

Yuzo Nagumo is currently employed at Shimadzu Corporation, where he continues to develop innovative technologies in surface processing. His work has significantly advanced the capabilities of thickness monitoring and etching depth measurement.

Collaborations

Nagumo collaborates with talented coworkers, including Rui Kato and Hiroomi Goto, who contribute to his research and development efforts.

Conclusion

Yuzo Nagumo's contributions to surface processing technologies exemplify his dedication to innovation and precision in measurement systems. His patents reflect a commitment to advancing the field and improving industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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