Miyazaki, Japan

Yuya Fusayasu

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuya Fusayasu. Retrieved from https://idiyas.com/inventor/yuya-fusayasu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Yuya Fusayasu

Introduction

Yuya Fusayasu is a notable inventor based in Miyazaki, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative surface texture measuring machine. His work exemplifies the intersection of engineering and practical application in industrial settings.

Latest Patents

Yuya Fusayasu holds a patent for a measuring device that includes a display section, a touch panel, and a key group. This surface texture measuring machine is designed to create measurement conditions based on user input through the touch panel. The device features a storage section for measurement conditions and an input control section that manages the touch panel's state. This innovation enhances the efficiency and accuracy of surface texture measurements.

Career Highlights

Fusayasu is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His role involves developing advanced measuring instruments that cater to various industrial needs. His dedication to innovation has positioned him as a key figure in the field.

Collaborations

Yuya Fusayasu has collaborated with talented coworkers, including Hiroomi Honda and Takashi Shintaku. Their combined expertise contributes to the development of cutting-edge measurement solutions.

Conclusion

Yuya Fusayasu's contributions to measurement technology through his innovative patents and collaborations highlight his importance in the field. His work continues to influence the industry and improve measurement practices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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