The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Mar. 18, 2024
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Yuya Fusayasu, Miyazaki, JP;

Hiroomi Honda, Miyazaki, JP;

Takashi Shintaku, Hiroshima, JP;

Kazuya Ibi, Hiroshima, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06F 3/02 (2006.01); G06F 3/041 (2006.01); G06F 3/0482 (2013.01); G06F 3/04847 (2022.01);
U.S. Cl.
CPC ...
G06F 3/0482 (2013.01); G06F 3/0219 (2013.01); G06F 3/0412 (2013.01); G06F 3/04847 (2013.01);
Abstract

A surface texture measuring machine includes a display section, a touch panel arranged on the display section, a key group, a display control section that causes a first setting screen to be displayed on the display section, a setting section that creates a measurement condition in accordance with an input operation on the first setting screen through the touch panel, a storage that stores the measurement condition, and an input control section that switches a state of the touch panel between a disabled state and an enabled state. When the touch panel is in the disabled state, the display control section causes a second setting screen to be displayed on the display section in accordance with the input operation through the key group and the setting section reads the measurement condition from the storage in accordance with the input operation on the second setting screen through the key group.


Find Patent Forward Citations

Fusayasu, Yuya. (2026). Measuring device (U.S. Patent No. 12591354). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12591354

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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