Company Filing History:
Years Active: 2005-2011
Title: Yuusuke Tanba: Innovator in Charged Particle Beam Technology
Introduction
Yuusuke Tanba is a prominent inventor based in Hitachinaka, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of 3 patents. His innovative work has advanced the capabilities of imaging and detection systems, making them more efficient and effective.
Latest Patents
One of Yuusuke Tanba's latest patents is a charged particle beam device that separately detects secondary signal particles emitted from the surface of a sample. This device also identifies dark field signal particles scattered within and transmitted through the sample, as well as bright field signal particles that pass through without scattering. This innovation allows operators to observe images with optimal contrast tailored to specific applications. The device includes a transmitted signal conversion member with an opening that permits bright field transmitted signal particles to pass while detecting only the dark field transmitted signal particles scattered within the sample.
Career Highlights
Yuusuke Tanba is associated with Hitachi High-Technologies Corporation, where he has been instrumental in developing advanced technologies in his field. His work has not only contributed to the company's reputation but has also pushed the boundaries of what is possible in charged particle beam applications.
Collaborations
Yuusuke has collaborated with notable coworkers such as Mitsugu Sato and Kaname Takahashi. Their combined expertise has fostered an environment of innovation and creativity, leading to groundbreaking advancements in their projects.
Conclusion
Yuusuke Tanba's contributions to charged particle beam technology exemplify the spirit of innovation. His patents and collaborative efforts continue to influence the field, paving the way for future advancements.