Hitachi-high-technologies Corporation

Yuusuke Tanba

Mitsugu Sato

Shunya Watanabe

Kaname Takahashi

Mine Nakagawa

Atsushi Muto

Akinari Morikawa

The charged particle beam device of this invention separately detects secondary signal particles emitted from the surface of a sample, dark field signal particles scattered within and transmitted through the sample, bright field signal particles transmitted through the sample without being scattered within the sample, and thereby allows the operator to observe the image with an optimum contrast according to applications. In order to detect only the dark field transmitted signal particles scattered within the sample, among the transmitted signal particles obtained by the primary charged particle beams having transmitted through the thin film sample, the device includes a transmitted signal conversion member having an opening through which the bright field transmitted signal particles not being scattered within the sample can pass, and a detection means for detecting signals colliding against the conversion member.

Growing community of inventors

Hitachinaka, Japan

Yuusuke Tanba