Yuqing Guan

Title: Innovations of Yuqing Guan in Electron Probe Microanalysis

Introduction

Yuqing Guan is a notable inventor based in Shanghai, China. He has made significant contributions to the field of electron probe microanalysis, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of measurement instruments used in scientific research.

Latest Patents

Yuqing Guan holds a patent titled "Method for calibrating parameter error of electron probe microanalysis instrument." This patent discloses a method for calibrating parameter errors in electron probe microanalysis instruments. The process involves preparing a one-dimensional grating standard template using atom lithography technology. A theoretical grating period D is calculated, and the template is placed on the instrument's stage. The instrument scans the template, performs image acquisition, and measures the grid distance to obtain a measurement value L. A calibration factor K is then calculated based on D and L, which shortens the traceability chain for instrument calibration and reduces error accumulation in the measurement process.

Career Highlights

Yuqing Guan has worked at prestigious institutions such as the Shanghai Institute of Measurement and Testing Technology and Tongji University. His experience in these organizations has allowed him to develop and refine his innovative methods in measurement technology.

Collaborations

Yuqing has collaborated with notable colleagues, including Yunxia Fu and Xinbin Cheng. These partnerships have contributed to the advancement of research in the field of electron probe microanalysis.

Conclusion

Yuqing Guan's contributions to the field of electron probe microanalysis through his innovative patent demonstrate his commitment to improving measurement accuracy. His work not only enhances scientific research but also sets a foundation for future advancements in the field.