Yunwu Zhao

Title: Innovations by Inventor Yunwu Zhao

Introduction

Yunwu Zhao is a notable inventor based in Tianjin, China. He has made significant contributions to the field of integrated circuits and memory testing. With a total of 2 patents, his work focuses on enhancing the performance and efficiency of memory systems.

Latest Patents

One of Yunwu Zhao's latest patents is a method and apparatus for testing memory. This invention involves loading a first scan chain of flip-flops with data to test data retention and utilizing a memory built-in self-test (MBIST) wrapper circuit. The system is designed to enter a low-power state for a predetermined period before reading data from the memory, allowing for the assessment of data retention during this low-power state. Another significant patent is related to performance-based power management of a memory and data storage system. This invention includes power control circuitry that supplies a memory array with a voltage corresponding to its performance level, which can either be full performance or power-saving. Voltage sensing circuitry is also included to monitor the memory array's voltage level and output a power status signal, indicating when the memory can be accessed.

Career Highlights

Yunwu Zhao has worked with prominent companies in the technology sector, including Freescale Semiconductor, Inc. and NXP USA, Inc. His experience in these organizations has contributed to his expertise in memory systems and integrated circuits.

Collaborations

Throughout his career, Yunwu Zhao has collaborated with talented individuals such as Jing Cui and Shayan Zhang. These collaborations have likely fostered innovation and the development of advanced technologies in the field.

Conclusion

Yunwu Zhao's contributions to memory testing and power management in integrated circuits highlight his role as an influential inventor. His patents reflect a commitment to improving technology and enhancing system performance.