Flower Mound, TX, United States of America

Yulei Sun

This inventor holds 1 USPTO granted patent. Top assignee: Onto Innovation Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yulei Sun. Retrieved from https://idiyas.com/inventor/yulei-sun-oqbsifvi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Yulei Sun: Innovator in Semiconductor Manufacturing

Introduction

Yulei Sun is a prominent inventor based in Flower Mound, TX (US). He has made significant contributions to the field of semiconductor manufacturing, particularly through his innovative approaches to deep learning models.

Latest Patents

Yulei Sun holds 1 patent for a deep learning model in high-mix semiconductor manufacturing. This patent discloses techniques for applying a neural network deep learning model in a fabrication strategy for high-mix semiconductor manufacturing processes, including deposition, chemical-mechanical polishing (CMP), etching, photolithography, and plating. The patent describes both training and normal operation modes of the fabrication strategy.

Career Highlights

Yulei Sun is currently employed at Onto Innovation Inc., where he continues to advance the field of semiconductor technology. His work focuses on integrating advanced machine learning techniques into manufacturing processes, enhancing efficiency and precision.

Collaborations

Yulei collaborates with talented professionals such as Shelby Crain and Stephen McWilliams, contributing to a dynamic work environment that fosters innovation.

Conclusion

Yulei Sun's contributions to semiconductor manufacturing through his deep learning model patent exemplify the intersection of technology and innovation. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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