Location History:
- Tokyo, JP (2005 - 2012)
- Musashino, JP (2010 - 2017)
- Utsunomiya, JP (2020)
Company Filing History:
Years Active: 2005-2020
Title: The Innovations of Yukitoshi Otani
Introduction
Yukitoshi Otani is a prominent inventor based in Musashino, Japan. He has made significant contributions to the field of imaging technology, particularly in the development of apparatuses for inspecting polarizing films. With a total of five patents to his name, Otani's work reflects a deep understanding of optical engineering and innovation.
Latest Patents
Otani's latest patents include an imaging apparatus designed for obtaining images of polarizing films, as well as an inspection apparatus and method. The imaging apparatus features a light source that emits light toward the polarizing film to be inspected. It also includes an imaging unit positioned on the optical axis of the light source, with the polarizing film situated between them. Additionally, the apparatus may incorporate a circular polarizing plate or a wavelength plate to enhance its functionality. Another notable patent is the axially symmetric polarization conversion element, which converts incident light into an axially symmetric polarized beam. This element utilizes a reflection section shaped by rotating the cross-section of a Fresnel rhomb wave plate, effectively converting light through Fresnel reflections.
Career Highlights
Throughout his career, Yukitoshi Otani has worked with esteemed institutions such as Utsunomiya University and Yamatake Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in imaging technology.
Collaborations
Otani has collaborated with notable colleagues, including Toshitaka Wakayama and Toru Yoshizawa. Their combined expertise has likely fostered innovative solutions in their respective fields.
Conclusion
Yukitoshi Otani's contributions to imaging technology and his impressive portfolio of patents underscore his role as a leading inventor in Japan. His work continues to influence advancements in optical engineering and inspection methods.