Utsunomiya University

Nitto-denko Corporation

Hokkaido University

Yamatake Corporation

Tokyo University of Agriculture and Technology

Saitama Medical University

Yukitoshi Otani

Toshitaka Wakayama

Toru Yoshizawa

Atsushi Taniguchi

Ichiro Suehiro

Kazuhiko Oka

Hisatoshi Fujiwara

Shuhei Shibata

Shunsuke Sasaki

David Ignacio Serrano Garcia

Provided are a polarizing film imaging apparatus, a polarizing film inspection apparatus including the imaging apparatus, and a polarizing film inspection method using the imaging apparatus. The imaging apparatus includes: a light source that is configured to emit light toward a polarizing film to be inspected; an imaging unit that is arranged on an optical axis of the light source and on an opposite side to the light source with the polarizing film therebetween; and at least one of a circular polarizing plate arranged between the light source and the polarizing film, and a wavelength plate arranged between the polarizing film and the imaging unit.

Imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method

An axially symmetric polarization conversion element that converts incident light into an axially symmetric polarized beam includes a reflection section having a shape obtained by rotating the cross section of a Fresnel rhomb wave plate along the direction of an optical axis around an axis that is parallel to the optical axis. The axially symmetric polarization conversion element converts the incident light into an axially symmetric polarized beam by utilizing two Fresnel reflections by the reflection section.

Axially symmetric polarization conversion element

An optical characteristic measuring apparatus includes an optical systemincluding first and second carrier retardersandhaving the retardations being known and differing from each other. The optical characteristic measuring apparatus performs: a spectrum extraction process of extracting a plurality of spectral peaks from a frequency spectrum obtained by analyzing a light intensity signal detected by light-receiving/spectroscopic means; and an optical characteristic element calculation process of calculating an optical characteristic element representing optical characteristics of a measurement target based on the spectral peaks and the retardations of the first and second carrier retarders.

Optical characteristic measuring apparatus and optical characteristics measuring method

A measuring apparatus includes a light intensity information acquisition sectionthat acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical systemand a measurement target (or a sample), and a calculation sectionthat calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition sectionacquires the light intensity information relating to a plurality of the measurement lights obtained from the optical systemby changing setting of a principal axis direction of at least one of the optical elements. The calculation sectionperforms a carrier amplitude coefficient calculation process, and a matrix element calculation process that calculates the at least one matrix element based on a carrier amplitude coefficient and the theoretical expression for the carrier amplitude coefficient including the at least one matrix element.

Measuring apparatus, measuring method, and characteristic measurement unit

A grating () is disposed to face the measurement target surface of a measurement target object (). A light source () irradiates the grating () with illumination light. A camera () captures a moire fringe image formed on the grating () by light passing through the gratingand reflected by the measurement target surface. A moving means () changes the distance (H) between the gratingand the measurement target surface. An analyzing means () performs an analysis process of obtaining 3-D shape information of the measurement target surface from the image picked up by the camera () in at least two cases in which the distance (H) is set to different values, and obtains, on the basis of the 3-D shape information in each case and the distance H, true 3-D shape information from which the measurement error caused by the inclination of the measurement target surface is eliminated.

Surface shape measuring system

Growing community of inventors

Musashino, Japan

Yukitoshi Otani