The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 2020
Filed:
Jul. 30, 2018
Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;
Utsunomiya University, Utsunomiya-shi, Tochigi, JP;
Shunsuke Sasaki, Ibaraki, JP;
Ichiro Suehiro, Ibaraki, JP;
Shuhei Shibata, Utsunomiya, JP;
David Ignacio Serrano Garcia, Utsunomiya, JP;
Yukitoshi Otani, Utsunomiya, JP;
NITTO DENKO CORPORATION, Osaka, JP;
UTSUNOMIYA UNIVERSITY, Utsunomiya-shi, JP;
Abstract
Provided are a polarizing film imaging apparatus, a polarizing film inspection apparatus including the imaging apparatus, and a polarizing film inspection method using the imaging apparatus. The imaging apparatus includes: a light source that is configured to emit light toward a polarizing film to be inspected; an imaging unit that is arranged on an optical axis of the light source and on an opposite side to the light source with the polarizing film therebetween; and at least one of a circular polarizing plate arranged between the light source and the polarizing film, and a wavelength plate arranged between the polarizing film and the imaging unit.