This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Nagasaki University, Saga University, Smart Structures, Inc.. Active years: 2013-2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2013-2018
Title: Innovations by Yukihiro Ito
Introduction
Yukihiro Ito is a notable inventor based in Saga, Japan. He has made significant contributions to the field of crack detection and displacement measurement. With a total of 2 patents, his work has advanced the understanding and technology in these areas.
Latest Patents
Yukihiro Ito's latest patents include a cracking detection system and a cracking detection method. The crack detection system allows for the identification of cracks based on the strain distribution of an object. By capturing images of the area of interest before and after applying heat, the system analyzes the strain differences to detect cracks without the need to remove any coating layers. His second patent, a displacement/distortion measuring method and apparatus, provides a means to accurately measure displacement or distortion of an object. This method utilizes a line scanner to capture images of the object's surface, enabling precise measurements through image analysis.
Career Highlights
Throughout his career, Yukihiro Ito has worked at prominent institutions such as Saga University and Nagasaki University. His research and innovations have contributed to advancements in engineering and materials science.
Collaborations
Yukihiro has collaborated with notable colleagues, including Hiroshi Matsuda and Shuichi Yamazaki. Their joint efforts have furthered the development of innovative technologies in their respective fields.
Conclusion
Yukihiro Ito's contributions to crack detection and displacement measurement highlight his role as a significant inventor in Japan. His patents reflect a commitment to advancing technology and improving safety in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile