The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Oct. 17, 2014
Saga University, Saga, JP;
Nagasaki University, Nagasaki, JP;
Yukihiro Ito, Saga, JP;
Kazuhisa Shiki, Saga, JP;
Hiroshi Matsuda, Nagasaki, JP;
Akira Demizu, Nagasaki, JP;
SAGA UNIVERSITY, Saga, JP;
NAGASAKI UNIVERSITY, Nagasaki, JP;
Abstract
There is provided a crack detection system in which a crack can be detected from a strain distribution of a part to be detected of an object. After taking the image of the part to be detected of the detection object by the imaging unit, the heat is applied by the heating unit. Furthermore, image of the part to be detected are taken again and an image analysis unit analyzes the images before and after applying the heat to acquire a strain distribution of the part to be detected, so that the crack can be detected based on difference in a state of strain between a place where the crack exist and the other place. Therefore, taking the images of the part to be detected including its coating layer enables the analysis to progress without removing the coating layer to detect the crack.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile