The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2013
Filed:
Dec. 21, 2006
Hiroshi Matsuda, Nagasaki, JP;
Masakazu Uchino, Fukuoka, JP;
Yukihiro Ito, Saga, JP;
Kousuke Yoshimaru, Saga, JP;
Chikara Yamazaki, Saga, JP;
Shuichi Yamazaki, Saga, JP;
Kousuke Uchida, Saga, JP;
Hiroshi Matsuda, Nagasaki, JP;
Masakazu Uchino, Fukuoka, JP;
Yukihiro Ito, Saga, JP;
Kousuke Yoshimaru, Saga, JP;
Chikara Yamazaki, Saga, JP;
Shuichi Yamazaki, Saga, JP;
Kousuke Uchida, Saga, JP;
Smart Structures LLC, Rantoul, IL (US);
Abstract
Provided are a displacement/distortion measuring method and a displacement/distortion measuring apparatus for easily and highly accurately measuring displacement or distortion of an object. An image of the surface of the measuring object is picked up by a line scanner apparatus adhered or brought close to the surface of the measuring object. The image is taken, displacement or distortion is measured by image analysis of the image of the measuring object surface prior to time lapse and that after time lapse, and displacement or distortion measuring results are outputted.