This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Smart Structures, Inc.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Masakazu Uchino: Innovator in Displacement and Distortion Measurement
Introduction
Masakazu Uchino is a prominent inventor based in Fukuoka, Japan. He is known for his significant contributions to the field of measurement technology, particularly in the area of displacement and distortion measurement. His innovative approach has led to the development of advanced methods and apparatus that enhance measurement accuracy.
Latest Patents
Uchino holds a patent for a "Displacement/distortion measuring method and displacement/distortion measuring apparatus." This invention provides a solution for easily and highly accurately measuring the displacement or distortion of an object. The method involves capturing an image of the surface of the measuring object using a line scanner apparatus. By analyzing the images taken before and after a time lapse, the displacement or distortion can be measured effectively, and the results are outputted for further analysis.
Career Highlights
Masakazu Uchino has made a significant impact in his field through his work at Smart Structures, Inc. His expertise in measurement technology has positioned him as a key figure in the development of innovative solutions that address complex measurement challenges. His dedication to advancing technology is evident in his patent and ongoing research efforts.
Collaborations
Uchino collaborates with notable colleagues, including Hiroshi Matsuda and Yukihiro Ito. Their combined expertise fosters an environment of innovation and creativity, leading to the development of cutting-edge measurement technologies.
Conclusion
Masakazu Uchino's contributions to displacement and distortion measurement technology exemplify his commitment to innovation. His patent and collaborative efforts continue to influence the field, paving the way for future advancements in measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile