Saga, Japan

Chikara Yamazaki

This inventor holds 1 USPTO granted patent. Top assignee: Smart Structures, Inc.. Active years: 2013.


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Chikara Yamazaki: Innovator in Displacement Measurement Technology

Introduction

Chikara Yamazaki is a prominent inventor based in Saga, Japan. He is known for his innovative contributions to the field of displacement and distortion measurement technology. With a focus on precision and accuracy, Yamazaki has developed methods that enhance the measurement capabilities of various objects.

Latest Patents

Yamazaki holds a patent for a "Displacement/distortion measuring method and displacement/distortion measuring apparatus." This invention provides a solution for easily and highly accurately measuring the displacement or distortion of an object. The method involves capturing an image of the surface of the measuring object using a line scanner apparatus. By analyzing the images taken before and after a time lapse, the displacement or distortion can be effectively measured and outputted.

Career Highlights

Chikara Yamazaki has made significant strides in his career, particularly through his work at Smart Structures, Inc. His dedication to advancing measurement technology has positioned him as a key figure in the industry. His innovative approach has led to improved methodologies that benefit various applications.

Collaborations

Yamazaki collaborates with talented individuals such as Kousuke Yoshimaru and Hiroshi Matsuda. Together, they contribute to the development of cutting-edge technologies that push the boundaries of measurement science.

Conclusion

Chikara Yamazaki's work in displacement measurement technology exemplifies the spirit of innovation. His patent and contributions to Smart Structures, Inc. highlight his commitment to enhancing measurement accuracy. Through his efforts, he continues to influence the field positively.

Profile summary based on public USPTO records.
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