This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Tokyo Electron Limited. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: Yukihide Shigeno: Innovator in Probe Technology
Introduction
Yukihide Shigeno is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of probe technology, particularly in the development of apparatuses used for testing electrical characteristics of various objects. His innovative approach has led to the creation of a unique patent that enhances the precision of testing processes.
Latest Patents
Shigeno holds a patent for a "Probe apparatus with optical length-measuring unit and probe testing method." This invention features a probe apparatus equipped with control-position detection means for testing electrical characteristics of a to-be-tested object formed on a substrate. The apparatus includes a prober chamber, a susceptor for placing the object, and a moving mechanism that allows movement in multiple directions. Additionally, it incorporates a probe card with several probes and an optical length-measuring unit that detects the Z-directional position of the object based on reflected light. This innovative design aims to improve the accuracy and efficiency of testing procedures.
Career Highlights
Throughout his career, Yukihide Shigeno has worked with prominent companies in the technology sector. He has been associated with Tokyo Electron Limited and Screen Holdings Co., Ltd., where he contributed to advancements in probe technology and testing methodologies. His work has been instrumental in enhancing the capabilities of testing equipment used in various applications.
Collaborations
Shigeno has collaborated with notable professionals in his field, including Hiromi Chaya and Shigekazu Komatsu. These collaborations have fostered innovation and have led to the development of advanced technologies in probe testing.
Conclusion
Yukihide Shigeno's contributions to probe technology exemplify the impact of innovative thinking in the field of electrical testing. His patent and career achievements highlight his dedication to advancing technology and improving testing methodologies. His work continues to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
