Yukifumi Tsuda

This inventor holds 14 USPTO granted patents. Top assignees: Matsushita Electric Industrial Co., Ltd., Matsushita Research Institute Tokyo, Inc.. Active years: 1976-1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yukifumi Tsuda. Retrieved from https://idiyas.com/inventor/yukifumi-tsuda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 14

% Patents Active = 100.0

Average Co-Inventor Count = 5.1

ph-index = 9

Forward Citations = 183(Granted Patents)

Location History:

Kawasaki, JA (1976 - 1978)
Kawasaki, JP (1979 - 1993)

Company Filing History:

12 out of 27,375

Matsushita Electric Industrial Co., Ltd.

patents

2 out of 5

Matsushita Research Institute Tokyo, Inc.

patents

Years Active: 1976-1993

Loading Chart...

14 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5200799 - System for optically inspecting conditions of parts packaged on substrate (1993-04-06),

2. 5103105 - Apparatus for inspecting solder portion of a circuit board (1992-04-07),

3. 5027418 - Electro-optical inspection apparatus for printed-circuit boards with (1991-06-25),

4. 4983827 - Linescan apparatus for detecting salient pattern of a product (1991-01-08),

5. 4814867 - Color correction processor with memory addressed by color component (1989-03-21),

6. 4458265 - Color image duplicating system (1984-07-03),

7. 4394662 - Dot printer for reproduction of halftone images (1983-07-19),

8. 4180330 - Method of and a system for color separation (1979-12-25),

9. 4090243 - Color separating method and apparatus using statistical techniques (1978-05-16),

10. 4072958 - Ink injection type writing system using amplitude-modulated electrical (1978-02-07),

11. 4034406 - Facsimile signal transmission system (1977-07-05),

12. 4020502 - Method and apparatus for separating, combining and rearranging colored (1977-04-26),

13. 4011399 - Photographic image pick-up and coding system of run-length type (1977-03-08),

14. 3941922 - Facsimile system of run-length (1976-03-02),

Title: Innovations of Yukifumi Tsuda

Introduction

Yukifumi Tsuda is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of optical inspection systems, holding a total of 14 patents. His work focuses on enhancing the reliability and efficiency of inspecting electronic components on printed circuit boards.

Latest Patents

One of his latest patents is a "System for optically inspecting conditions of parts packaged on substrate." This system inspects the condition of parts on a printed circuit board by utilizing a position detecting device that receives scattered light from a laser beam. The system converts this light into a position signal, which is then used to obtain luminance data and height data of the parts. The final height data is compared with predetermined reference data to determine the package condition.

Another significant patent is the "Apparatus for inspecting solder portion of a circuit board." In this invention, a beam of light scans the surface of a circuit board with solder portions. Height data is derived from the scattered light, which represents the height of the scanned points. The system accumulates this height data and calculates variations to determine whether the solder portion is acceptable or unacceptable.

Career Highlights

Yukifumi Tsuda has worked with prominent companies such as Matsushita Electric Industrial Co., Ltd. and Matsushita Research Institute Tokyo, Inc. His experience in these organizations has contributed to his expertise in developing innovative inspection technologies.

Collaborations

He has collaborated with notable coworkers, including Hiroaki Kotera and Heijiro Hayami. Their combined efforts have led to advancements in the field of optical inspection systems.

Conclusion

Yukifumi Tsuda's contributions to optical inspection technology have significantly impacted the electronics industry. His innovative patents demonstrate his commitment to improving the reliability of electronic component inspections.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]