Ebina, Japan

Yuki Saeki

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Via Mechanics Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yuki Saeki. Retrieved from https://idiyas.com/inventor/yuki-saeki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Yuki Saeki: Innovator in Drilling Methods and Laser Machining

Introduction

Yuki Saeki is a notable inventor based in Ebina, Japan. He has made significant contributions to the field of machining technology, particularly through his innovative drilling methods and laser machining apparatus. His work focuses on improving efficiency and accuracy in machining processes.

Latest Patents

Yuki Saeki holds 1 patent for a drilling method and laser machining apparatus. This invention addresses the challenges posed by irregularities in workpiece surfaces, which can range from 10 to 30 micrometers in height. The patented method involves measuring the surface heights of a table at predetermined lattice points. It calculates the top surface height of a workpiece by considering the surrounding points, thereby enhancing machining efficiency.

Career Highlights

Saeki is associated with Hitachi Via Mechanics Ltd., where he applies his expertise in machining technology. His innovative approach has led to advancements in the industry, making significant impacts on production processes.

Collaborations

Yuki Saeki has worked alongside talented colleagues, including Hidenori Tateishi and Yasunobu Ueno. Their collaborative efforts contribute to the ongoing development of cutting-edge technologies in their field.

Conclusion

Yuki Saeki's contributions to drilling methods and laser machining demonstrate his commitment to innovation and efficiency in manufacturing. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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