Location History:
- Newark, CA (US) (2020 - 2023)
- Pleasanton, CA (US) (2023)
Company Filing History:
Years Active: 2020-2025
Title: Yujie Dong: Innovator in Defect Detection and Mode Selection
Introduction
Yujie Dong is a prominent inventor based in Newark, CA, known for his contributions to the fields of defect detection and optical mode selection. With a total of 4 patents to his name, Dong has made significant strides in developing systems that enhance the accuracy and efficiency of semiconductor applications.
Latest Patents
One of Yujie Dong's latest patents is focused on mode selection and defect detection training. This innovative system is designed for joint defect discovery and optical mode selection. It detects defects during a defect discovery step and accumulates the discovered defects into a mode selection dataset. This dataset is then utilized to perform mode selection, determining a mode combination that can be used to train the defect detection model. The system is capable of detecting additional defects at an image pixel level, further refining the defect detection process.
Another notable patent by Dong involves learnable defect detection for semiconductor applications. This system incorporates a deep metric learning defect detection model that projects a test image and a corresponding reference image into latent space. By determining the distance between different portions of the test image and the reference image, the system can effectively detect defects. Additionally, it includes a learnable low-rank reference image generator that removes noise from test images, generating reference images that enhance the accuracy of defect detection.
Career Highlights
Yujie Dong has worked with notable companies in the semiconductor industry, including Kla Corporation and KLA-Tencor Corporation. His experience in these organizations has contributed to his expertise in developing advanced technologies for defect detection and mode selection.
Collaborations
Throughout his career, Dong has collaborated with talented individuals such as Jing Zhang and Kris Bhaskar. These collaborations have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Yujie Dong's work in defect detection and mode selection has positioned him as a key innovator in the semiconductor field. His patents reflect a commitment to advancing technology and improving processes within the industry.