Singapore, Singapore

Yudi Dou

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Tetramem Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yudi Dou. Retrieved from https://idiyas.com/inventor/yudi-dou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Yudi Dou and Memory Error-Correction Innovation.

Introduction

Yudi Dou is an inventor associated with Singapore and Tetramem Inc. Her patent work addresses error detection and correction in multi-level cell-based memory devices, where reliable data retrieval is essential.

Latest Patents

Dou is associated with 1 patent: “Enhanced Error Correction Code for Error Detection and Correction in Multi-Level Cell-Based Memory Devices.” The invention describes methods in which an error-correction-code decoder receives encoded data from a memory device and uses Reed–Solomon error-correction coding to calculate an error value and location. It classifies errors as absent, single-symbol, or multiple-symbol errors using a +1/−1 error constraint. When multiple-symbol errors are detected, the method repeats the read from the memory device.

Career Highlights

Dou’s listed patent reflects work on improving the reliability of data stored in multi-level cell-based memory. The approach combines error analysis with a repeat-read response to address cases involving multiple symbol errors.

Collaborations

The patent information names Lei Liu and Jun Sheng Ng as Dou’s coworkers. The invention is associated with Tetramem Inc.

Conclusion

Yudi Dou’s patent focuses on strengthening error detection and correction for multi-level cell-based memory, contributing a method for identifying error types and responding to multiple-symbol errors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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