Yuan Sang

Title: Innovations by Inventor Yuan Sang

Introduction

Yuan Sang is a notable inventor based in Shanghai, China. He has made significant contributions to the field of technology, particularly in memory module testing systems. With a total of 2 patents to his name, Yuan has demonstrated his expertise and innovative spirit in his work.

Latest Patents

Yuan Sang's latest patents include a "Dummy dual in-line memory module (DIMM) testing system based on boundary scan interconnect and method thereof." This invention utilizes a dummy DIMM functioning normally as a test fixture, allowing for efficient testing of a unit under test (UUT) through a test device. The system enhances testing convenience by enabling boundary scan control to verify the test results based on data signals collected from boundary scan registers.

Another significant patent is the "DIMM slot test system without series connection of test board through JTAG and method thereof." This invention involves a DIMM connector interface that connects to a circuit board under test. The CPU generates test data and signals, which are transmitted to a specified CPLD chip for recording and testing power or ground pins. This innovative approach streamlines the testing process and improves accuracy in results.

Career Highlights

Yuan Sang has worked with prominent companies such as Inventec Technology Corporation and Inventec Corporation. His experience in these organizations has contributed to his development as an inventor and has provided him with valuable insights into the technology industry.

Collaborations

Yuan has collaborated with notable coworkers, including Chang-Qing Mu and Xue-Shan Han. These partnerships have likely fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Yuan Sang is a distinguished inventor whose work in memory module testing systems has made a significant impact in the technology sector. His innovative patents reflect his commitment to improving testing processes and enhancing the efficiency of electronic components.