This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995
Title: Innovations of Yu-Wu Zhang in Surface Measurement Technology.
Introduction
Yu-Wu Zhang is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of surface measurement technology. His work focuses on developing innovative apparatuses that enhance the accuracy and efficiency of measuring surface roughness.
Latest Patents
Yu-Wu Zhang holds a patent for an "Apparatus for measuring surface roughness." This invention includes a pickup designed to scan the surface of an object and output an electric signal corresponding to an unfiltered profile curve. Additionally, it features a low-pass filter that extracts low-frequency components corresponding to a waviness profile curve from the electric signal. The low-pass filter comprises two cascade-connected filters expressed by a transfer function G(s) with an adjusting coefficient, ζ, ranging from 0.7134 to 1.1083. This innovative approach allows for more precise measurements of surface characteristics.
Career Highlights
Yu-Wu Zhang is currently employed at Mitutoyo Corporation, a leading company in precision measurement instruments. His work at Mitutoyo has allowed him to apply his expertise in surface measurement technology and contribute to the development of advanced measurement solutions.
Collaborations
Yu-Wu Zhang collaborates with Masanobu Kataoka, a fellow professional in the field. Their partnership enhances the research and development efforts at Mitutoyo Corporation, leading to innovative advancements in measurement technology.
Conclusion
Yu-Wu Zhang's contributions to surface measurement technology through his patent and work at Mitutoyo Corporation highlight his role as an influential inventor. His innovative approaches continue to shape the industry and improve measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
