Hsinchu, Taiwan

Yu-Hui Lu

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yu-Hui Lu. Retrieved from https://idiyas.com/inventor/yu-hui-lu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Innovations of Yu-Hui Lu in Integrated Circuit Technology

Introduction

Yu-Hui Lu is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of integrated circuit technology, particularly in the area of critical dimension verification. His work is essential for advancing the precision and reliability of semiconductor manufacturing processes.

Latest Patents

Yu-Hui Lu holds a patent titled "Calibration standard for critical dimension verification of sub-tenth micron integrated circuit technology." This patent describes a critical dimension control wafer designed for calibrating process control scanning electron microscopes. The test wafer features one or more test structures, each consisting of an array of parallel trenches that are precision micro-machined in a metal plate. The trenches are formed in an aluminum/copper alloy plate using focused ion beam milling. This innovative approach results in lower width roughness and lower edge roughness compared to similar patterns formed in polysilicon through conventional photolithographic methods. Additionally, the invention effectively eliminates electron charging in the scanning electron microscope, which can distort images. The dimensions of the trenches and the metal lines between them are comparable to those of polysilicon lines used in sub-tenth micron integrated circuit process technology control wafers. The control wafers are calibrated using a laboratory-grade scanning electron microscope, and once calibrated, they can be stockpiled for routine use as a high-precision dimensional reference.

Career Highlights

Yu-Hui Lu is currently employed at Taiwan Semiconductor Manufacturing Company Ltd., where he continues to innovate and contribute to the semiconductor industry. His expertise in critical dimension control is vital for ensuring the accuracy and efficiency of manufacturing processes.

Collaborations

Yu-Hui Lu collaborates with Tien-Chi Wu, who is also a key figure in his research endeavors. Their partnership enhances the development of advanced technologies in the semiconductor field.

Conclusion

Yu-Hui Lu's contributions to integrated circuit technology through his innovative patent demonstrate his commitment to advancing the semiconductor industry. His work not only improves the precision of manufacturing processes but also sets a standard for future innovations in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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