Zhubei, Taiwan

Young-Huang Chou

This inventor holds 1 USPTO granted patent. Top assignee: Mpi Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Young-Huang Chou. Retrieved from https://idiyas.com/inventor/young-huang-chou

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Young-Huang Chou: Innovator in Probe Card Technology

Introduction

Young-Huang Chou is a notable inventor based in Zhubei, Taiwan. He has made significant contributions to the field of electronics, particularly with his innovative work on probe cards. His inventions have the potential to enhance testing efficiency in various applications.

Latest Patents

Young-Huang Chou holds a patent for a probe card that offers advanced functionalities. This probe card can serialize, analogize, and divide a digital signal through an analog-to-digital converter (ADC), a digital-to-analog converter (DAC), and a power divided unit. The design allows for an increase in signal channels, enabling the testing of multiple devices under test (DUTs) simultaneously. Additionally, the probe card features fine impedance matching and channel separation, which improves testing efficiency and minimizes signal loss.

Career Highlights

Chou is currently employed at Mpi Corporation, where he continues to develop innovative solutions in the electronics sector. His work has garnered attention for its practical applications and contributions to the industry.

Collaborations

Throughout his career, Young-Huang Chou has collaborated with talented individuals such as Wei-Cheng Ku and Wen-Pin Su. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Young-Huang Chou's contributions to probe card technology exemplify his commitment to innovation in the electronics field. His work not only enhances testing capabilities but also sets a standard for future advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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