The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2013
Filed:
Mar. 17, 2010
Young-huang Chou, Zhubei, TW;
Wei-cheng Ku, Zhubei, TW;
Wen-pin Su, Zhubei, TW;
Jun-liang Lai, Zhubei, TW;
Chao-ping Hsieh, Zhubei, TW;
Ping-hsiao Liao, Zhubei, JP;
Young-Huang Chou, Zhubei, TW;
Wei-Cheng Ku, Zhubei, TW;
Wen-Pin Su, Zhubei, TW;
Jun-Liang Lai, Zhubei, TW;
Chao-Ping Hsieh, Zhubei, TW;
Ping-Hsiao Liao, Zhubei, JP;
MPI Corporation, Zhubei, TW;
Abstract
A probe card is provided. The probe card can serialize, analogize and divide a digital signal by a analog-to-digital converter (ADC), a digital-to-analog converter (DAC), and a power divided unit respectively. The probe card can increase signal channels, and is not restricted by signal channels of a tester to test more DUTs simultaneously. Moreover, the probe card has fine impedance matching and channels separating to raise testing efficiency and reduce signal loss.