Yotam Nissim Ben Shoshan

Title: Yotam Nissim Ben Shoshan: Innovator in Semiconductor Defect Examination

Introduction

Yotam Nissim Ben Shoshan is a prominent inventor based in Rehovot, Israel. He has made significant contributions to the field of semiconductor technology, particularly in the area of defect examination. His innovative approach utilizes machine learning to enhance the accuracy and efficiency of semiconductor inspections.

Latest Patents

Yotam holds a patent for a groundbreaking invention titled "Machine learning based defect examination for semiconductor specimens." This patent describes a system and method for examining semiconductor specimens. The method involves obtaining a runtime image of the specimen and processing it using a first machine learning model to extract a set of runtime features. These features are then compared with a bank of reference features, resulting in an anomaly map that indicates defective patches in the runtime image. The bank of reference features is generated from synthetic reference images created by a second machine learning model, which are processed to extract representative features.

Career Highlights

Yotam is currently employed at Applied Materials Israel Limited, where he continues to develop innovative solutions in semiconductor technology. His work focuses on integrating advanced machine learning techniques into traditional semiconductor inspection processes, thereby improving defect detection and analysis.

Collaborations

Yotam collaborates with talented colleagues, including Yehonatan Hai Ofir and Ran Badanes. Their combined expertise fosters a creative environment that drives innovation in their projects.

Conclusion

Yotam Nissim Ben Shoshan is a key figure in the advancement of semiconductor defect examination through machine learning. His contributions are paving the way for more efficient and accurate semiconductor manufacturing processes.